Focal Length: 160mm
Detector: Silicon Photocell
Wavelength Range: 200-1000nm

Working Principle: Energy Dispersive X-ray Fluorescence
Internal measurement chamber dimensions: dia100*75mm
Overall resolution: ≤155eV
Measuring distance: 0~15mm

Working Principle: Energy Dispersive X-ray Fluorescence
Internal measurement chamber dimensions: dia100*75mm
Overall resolution: ≤160eV
X-ray receiver: SI-PIN detector

Wavelength Range: 190-1100nm
Bandwidth: 2nm Deuterium lamp service life: 500 hours Stray Light: ≤0.2%T

Wavelength Range: 360~780nm Measurement wavelength interval: 10nm Integrating sphere diameter: 152mm Half spectral width: 5nm

Excitation source: High-power miniature straight plate X-ray tube
Filter: Tow filters are configured
Test method: Basic parameter method
Operating system: Window CE 6.0 operating system

Detector: Moxtek SI-PIN detector/KETEK SDD detector
Display: high-resolution LCD screen
Processor: digital multi-channel data processor

Operating temp requirements: -20~50℃
Operating humidity requirements: 10~90% (no condensation)
Excitation source: High-power high-performance X-ray microtube
Detector: Si-pin detector