Working Principle: Energy Dispersive X-ray Fluorescence
Internal measurement chamber dimensions: dia100*75mm
Overall resolution: ≤160eV
X-ray receiver: SI-PIN detector

Working Principle: Energy Dispersive X-ray Fluorescence
Internal measurement chamber dimensions: dia100*75mm
Overall resolution: ≤155eV
Measuring distance: 0~15mm

Wavelength Range: 190-1100nm
Bandwidth: 2nm Deuterium lamp service life: 500 hours Stray Light: ≤0.2%T

Scale: H2O2 (g/100g)
Range: H2O2 : 0.0 to 50.0% Resolution: 0.2%
Accuracy: ±0.6%

Sphere Size: Dia 40mm
Wavelength Range: 400-700nm
Wavelength Interval: 10nm
Reflectance Range: 0-200%, resolution 0.01%

Illumination system: 8/d, SCE
Measuring caliber: 8mm and 4mm
Measuring range: L*:1-100
Measuring time: About 0.5 seconds

Measurement structure: D/8, including specular reflection light (SCI)
Measuring caliber: 8mm
Wavelength interval: 10nm
Wavelength range: 400-700nm
 

Measurement mode: reflection Wavelength Range: 400-700nm Illumination Light source: CLEDs Measurement time: 0.5 seconds  

Wavelength Range: 360-780nm Sensor: Silicon Photodiode Array Grating Method: Concave Grating Sphere Diameter: 152mm

Wavelength Range: 360~780nm Measurement wavelength interval: 10nm Integrating sphere diameter: 152mm Half spectral width: 5nm

Excitation source: High-power miniature straight plate X-ray tube
Filter: Tow filters are configured
Test method: Basic parameter method
Operating system: Window CE 6.0 operating system

Detector: Moxtek SI-PIN detector/KETEK SDD detector
Display: high-resolution LCD screen
Processor: digital multi-channel data processor